Preface
Electron Attenuation Length in AES and XPSA. Jablonski・・・・125
Lectures
Historical Auger Electron Spectroscopy. IIKeisuke Goto・・・・127
A Few Applications of AES Chemical State Analysis (in Japanese)
Yoshimi Abe・・・・139
Log-Log Display of AES Spectra: Advanced Sickafus Plot
Y.Z. Jiang, K. Goto, R. Shimizu・・・・147
Backgrounds of Electron-exited Auger Specra (in Japanese)
M. Jo・・・・150
The Analysis which is Possible by using EPMA (in Japanese)
Yoshiro Ohtsuka・・・・152
Topical Reports
Chemical State Analysis in Microscopic Area with Electron Probe Micro Analyzer (in Japanese)N. Niwa・・・・157
Typical Changes of Characteristic X-ray Line Shapes Obtained by EPMA (in Japanese)
Yoshimi Abe, Yuki Abe, Tomohisa Nakamura・・・・160
Report from SERD Project (2) (in Japanese)
SERD project group of SASJ・・・・164
Standardization
ISO Standard on Calibration of Energy Scale for XPS“ Surface Chemical Analysis- X-ray Photoelectron Spectrometers-Calibration of Energy Scale ”(in Japanese)
Satoshi Hashimoto and Shigeo Tanuma・・・・166
Activity and Current State of ISO/TC201/SC4: Depth Profiling (in Japanese)
Mineharu Suzuki・・・・173
Papers
Temperature Measurement of Specimen in XPS Analysis (in Japanese)Toshio Sato・・・・175
Examination of Detection Limit and Background Reduction using Grazing Incidence X-ray Photoelectron Spectroscopy (in Japanese)
Makoto Nakamura・・・・183
Alternation of Ti 2p XPS Spectrum for TiO2by Low Energy Ar Ion Bombardment (in Japanese)
Satoshi Hashimoto and Akihiro Tanaka・・・・192
Evaluation of SiO2 films and SiO2/Si Interfaces by Graded Etching (in Japanese)
Masakazu Nakamura and Yoshitsugu Nakagawa・・・・201
A Specimen Preparation Method of Porous Material (in Japanese) for Small Cross-section Area Analysis by AES
Shiori Shirai, Michiko Satoh and Makoto Sasaki・・・・208
Surface Analysis of Glaze on Sanitary Ware (in Japanese)
Junichi Iwasawa, Toshihiro Aoshima, Masaaki
Ito, Masami Ando and Yasushi Moriyama・・・・215
Technical Reports
Thin Film Method for Insulator Specimen in Auger Analysis (in Japanese)K. Tsutsumi, T. Suzuki, Y. Sakai and Y. Nagasawa・・・・223
Important Information from SASJ Network Service
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Minute of the SERD Project Meetings (1st-3rd)
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Minute of the 15th SASJ meeting
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Minute of the 19th meeting of SASJ executive committee
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Member list of SASJ executive committee
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SASJ member ID application form
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Spectral Database: Guide for Submission to SASJ
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Journal of Surface Analysis: Guide for Authors
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