Preface
At the beginning of the YearRyuichi Shimizu・・・・1
Papers
Ghost Spectra and Rubbish Electrons in a CMAN. Nissa Rahman, K. Goto and R. Shimizu・・・・2
Silicide Formation Process for Source-Drain Depending on Silicon Substrate Type in Advanced CMOS Logic Devices (in Japanese)
Makoto Nakamura・・・・9
Lectures
Depth Profiling Analysis by Auger Electron Spectroscopy (in Japanese)Shigeo Tanuma・・・・17
Spectrometer function of various AES instruments
Michiko Yoshitake・・・・37
Effect of Transmission Function on XPS Quantitative Analysis (in Japanese)
Natsuo Fukumoto・・・・45
Background Removal (in Japanese)
Hajime Thoma・・・・49
The Practice of QUASES-Tougaard Method (in Japanese)
Masahiro Arai・・・・55
Topical Reports
Surface Quantification Method with Average Matrix Sensitivity Factors (in Japanese)Shigeo Tanuma・・・・61
Data Mining by Self-Organizing Maps using XPS Spectra of 77 Elements (in Japanese)
Yohihiro Ikeda, Yohifumi Hori, Yoshinori Morita, Kikuo Fujimura,Heizo Tokutaka, Kwaw Obu-cann and Kazuhiro Yoshihara・・・・65
A study on absolute measurements of number of X-ray quanta in XPS:calorimetry (in Japanese)
K. Goto and Y. Agata, Y. Sakai・・・・68
Opening the Time Capsule EXPO’70 (in Japanese)
Atsuko Kojima, Midori Takano and Takuichi Ohmura・・・・70
Report on Sputter Etching Rate Database (SERD) Project of SASJ (in Japanese)
SERD project group of SASJ・・・・76
One Point Technique
Sample Positioning system using Laser-pointer (in Japanese)Kazuhiko Dohmae・・・・86
Salon in SASJ
Report from 4th Meeting on Practical Surface Analysis, PSA-00 (in Japnese)PSA-00 executive committee・・・・88
Minute of the 18th meeting of SASJ executive committee
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Member list of SASJ executive committee
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SASJ member ID application form
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Spectral Database: Guide for Submission to SASJ
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Journal of Surface Analysis: Guide for Authors
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Journal of Surface Analysis: Cumulative Author Index / Contents of Vol.7
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