Contents of JSA Vol.7 No.2 (2000) 148 - 298

Preface

Harmonization of Private and Public Activities

Lecture

Microanalysis by an analytical electron microscope (in Japanese)

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Self-recovery function on Zr-O/W(100) surface at high temperature (in Japanese)

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Small Area XPS analysis of industrial materials (in Japanese)

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Evaluation of Spatial Resolution and Light Elements Analysis of Precipitates in Steel by AES (in Japanese)

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Chemical Spectra Analysis via Internet (in Japanese)

Papers

Work Function Measurements by High Spatial Resolution using a Scanning Auger Electron Microscope (in Japanese)

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The Accurate Correction Technique for Quantitative AES Analysis of Ceramic Surface (in Japanese)

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Estimation of Residual Gas in UHV Chamber Based on Initial Oxidation Study of GD (in Japanese)

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Investigation of Mounting Methods in Composite Materials for XPS (in Japanese)

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Thickness Measurements of Native Oxide Layer on the Polycrystal Silicon exposed to the Air for Three Years (in Japanese)

Technical Reports

Hole-shape-optimization by FIB Sample Preparation for AES Small Area Analysis (in Japanese)

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Imaging of Defects in IIa Diamond by Cathodoluminescence Field Emission Scanning Electron Microscope

Data Reports

Presented Data for SASJ Spectral Database (in Japanese)

Topics

Evaluation of SiO₂ film by EELS(2) (in Japanese)

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Cross-sectional Imaging of AlGaAs/GaAs Multilayers by ToF-SIMS (in Japanese)

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Energy Calibration by using elastically backscattered primary Electrons in AES:10〜1200eV (with improved CMA) (in Japanese)

Salon in SASJ

Network discussion (in Japanese)

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Report on　International Symposium - IMFP 2000 – (in Japanese)

Bulletin Board

PSA-01/ First Announcement Journal of Surface Analysis: Guide　for authors

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Journal of Surface Analysis:Cumulative Author Contents/Index of Volume 6

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