Contents of JSA Vol.6 No.1 (1999) 1 - 130

Preface

To Continue the Collaboration

D. W. Moon・・・・1

Lecture: Practical Surface Analysis

The Basis of Electron Spectroscopy for Surface

J. T. Grant・・・・2

Practical Aspects of Charge Compensation in X-ray Photoelectron Spectroscopy

J. E. Fulghum・・・・13

Simulation of time-dependent Charging of Insulators under Electron Beam Irradiation (in Japanese)

M. Kotera・・・・22

Papers

Quantification of dimer (Al²⁺, Ga²⁺) SIMS Depth profiles of a GaAs/AlAs Multilayer Structure using the MRI-model

A. Rar, D. W. Moon, and S. Hofmann・・・・29

Evaluation of SIMS depth resolution with Delta Multi-layer Reference Materials

D. W. Moon and K. J. Kim・・・・34

Study of Electron Beam Irradiation Damage Factor for SiO₂ Films

M. Nakamura and Electronic Mterials Group of SASJ・・・・38

Core Level and Auger Line Shifts in CoPt Alloys

Y. S. Lee, K. Y. Lim, Y. D. Chung, H. J. Kang, and C. N. Whang・・・・45

Studies of Polystyrenes Using Time-of-Flight Secondary Ion Mass Spectrometry

Y. Lee, S. Han, J.-H. Yoon, H. Lim, and J. Cho・・・・50

Surface Damage of Organic Materials during XPS Analysis (3)

K. Endo, S. Maeda, H. Miura, K. Ohmori, K. Miura, H. Tohma, T. Maruyama, and Organic Materials Group of SASJ・・・・54

A Method of Evaluating Sample Damage in XPS using Nitrocellulose as a Standard for Organic Materials

T. Maruyama, N. Suzuki, H. Tohma, K. Miura, and Organic Materials Group of SASJ・・・・59

Surface Characterization of Organic Electroluminescent Thin Film Materials

J. W. Lee, T. H. Kim, S. H. Kim, and S. T. Kim・・・・66

Technical Reports

The "Spectral Data Processor" for Windows 3.1, 95, 98, NT or OS/2 and The "SpecMaster Pro" Digital Database System of 35,000 XPS Spectra

B. V. Crist・・・・71

Reference Materials Used in My Laboratory

M. Furuya・・・・77

Introduction of COMPRO Version 6 (in Japanese)

K. Yoshihara・・・・82

Topical Reports

Chemical Analysis of XPS (X-ray Photoelectron Spectroscopy) Data using Self-Organising Maps

K. Obu-cann, H. Tokutaka, K. Fujimura, K. Yoshihara, and Metal Materials Group of SASJ・・・・85

Charge Neutraliser for Magnetic Lens System (in Japanese)

K. Takahashi・・・・87

Chrage Compensation Studies for Insulators in AES by Low Energy Ion Beam Irradiation

H. Iwai・・・・90

Salon in SASJ

Discussions on Internet (in Japanese)

Editorial Committee・・・・92

Bulletin Board

Looking Back to a Great Experience

S. Hofmann・・・・96

Report from PSA- PSA-98 International Symposium on Practical Surface Analysis(in Japanese)

・・・・・・・・・・・・98

Report from 2-nd Korea-Japan International Symposium on Surface Analysis "Practical Analysis and Standardization" (in Japanese)

・・・・・・・・・・・・100

Minutes of Working groups

8-th and 9-th meeting of Database Committee

・・・・・・・・・・・・102

12th meeting of Organic Materials Group

・・・・・・・・・・・・103

12th meeting of Inorganic Materials Group

・・・・・・・・・・・・104

12th meeting of Metal Materials Group

・・・・・・・・・・・・105

12th meeting of Electronic Materials Group

・・・・・・・・・・・・107

Journal of Surface Analysis: Guide for Authors

・・・・・・・・・・・・114

Journal of Surface Analysis: Cumulative Author Index/Contents of Volume 4

・・・・・・・・・・・・121