Proceedings of PSA 98 (1998) Part 2
Charge Referencing of XPS Spectra from Fluorocarbon Polymer Films using Fluorine as an Internal Standard
T. Ichiki, H. Oshio, and Y. Horiike・・・・193
Optimization of an Electrometer on Noise and Linearity
K. Goto, J. Y. Zhong, and N. N. Rahman・・・・197
Comparison of XPS Spectra of Inorganic Materials with Various Kinds of Pre-treatment Methods
N. Fukumoto, B. Q. Li, and I. Kojima・・・・200
Interfacial Reaction of Cu/Polyimide using XPS
Y. S. Lee, K. Y. Lim, Y. D. Chung, and C. N. Whang・・・・204
Chemical Analysis of AES, XPS and XRD data using Self Organising Maps
K. Obu-Cann, H. Tokutaka, K. Fujimura, K. Yoshiahra, and Metal Materials Group of SASJ・・・・208
A New Resonace Photoionization SNMS Instrument for Submicron Microarea Analsysis
H. Shichi, S. Osabe, M. Sugaya, K. Kanehori, and Y. Mitsui・・・・212
Surface Characterization of Polystyrene Treated with Plasma Source Ion Implantation
Y. Lee, S. Han, J.-H. Yoon, H. Lim, J. Cho, and Y. Kim・・・・216
Surface Damage of Organic Materials during XPS Analysis (1)
H. Tohma, K. Miura, and Organic Materials Group of SASJ・・・・220
Surface Damage of Organic Materials during XPS Analysis (2)
N. Suzuki, T. Sakamoto, T. Isano, K. Iimura, T. Kato, H. Tohma, T. Maruyama, K. Miura, and Organic Material Group of SASJ・・・・224
Evaluation of Glass Fiber Reinforced Plastics by XPS and TOF-SIMS
C. Kurusu, T. Nakayama, and K. Sasakawa・・・・228
Evaluation of Resin by XPS and TOF-SIMS
K. Sasakawa, C. Kurusu, and T. Nakayama・・・・231
Degradation of Polymers (PVC, PTFE, M-F) during X-ray Photoelectron Spectroscopy (XPS-ESCA) Analysi
G. Coullerez, Y. Chevolot, D. Leonard, N. Xanthopoulos, and H. J. Mathieu・・・・235
AES in Metallurgy: Materials Design Based on Anisotropy of Grain Boundary Segregation
P. Lejcek・・・・240
XPS and AES Study of Au/GaN and Au/Cr/GaN Contacts
J. H. Kim, I. Y. Hwang, H. J. Kang, C. Y. Kim, S. R. Park, and J. M. Seo・・・・246
GD-OES Characterization of Copper Enrichment at the Interface between Oxide Layer and Matrix in Iron-Copper Alloys
S. Suzuki and Y. Takagi・・・・250
Effects of Phosphorus in Steel on Galvannealing Behavior of Galvanized Steel
S. Hashimoto, K. Tahara, E. Hamada, M. Sakurai, J. Inagaki, and M. Sagiyama・・・・254
The Effect of X-ray Scanning on Intensity and Binding Energy of Photoelectron Peak and the Line Scanning Analysis of an Etched Crater
M. Yoshitake and K. Yoshihara・・・・258
X-ray Photoelectron Spectroscopy Study of Ba1-xAxBiOy Superconductors
Y. Mitani, N. Sato, S. Kishida, H. Naoe, F. Toda, and H. Tokutaka・・・・262
AES, REELS Study of Fe/Ni Alloys
Y. Abe and Metal Materials Group of SASJ・・・・266
Fe-Ni Alloys Studied by XPS
N. Okude, M. Furuya, and Metal Materials Group of SASJ・・・・270
GD-OES/XPS Study of the Surface of Silicon Steel Sheets Annealed in Atmosphere with Various H2O/H2 Ratios
S. Suzuki, K. Yanagihara, S. Hayashi and S. Yamazaki・・・・274
Relative Yields of Secondary Ions Sputtered from Fe, FeO, Fe3O4 and Fe2O3 by Cs+ and O2+
S. Suzuki, K. Yanagihara, S. Hayashi, and T. Mori・・・・278
GDOS/XRD Study of Alloying Processes in Zinc Coated Steel Sheet by Annealing at High Temperatures
S. Suzuki, T. Suzuki, M. Kimura and M. Imafuku・・・・282
RHEED and AES Study of Metal-Insulator-Metal Thin Film Systems: Nb-Al2O3-Nb
K. Masek, R. Kapsa, B. Gruzza, and V. Matolin・・・・286
Pb-valence Studied by XPS and Chemical Analysis
M. Nagoshi, M. Kikuchi, M. Shida, Y. Syono, and Y. Fukuda・・・・290
Phosphorus Grain Boundary Segregation in Polycrystalline Low Alloy Steels
J. Janovec, D. Grman, V. Magula, J. Patscheider, P. Lejcek, P. Sevc, and
J. Blach・・・・294
Surface Analysis for Glass Coating Technology
K. Matsumoto・・・・298
XPS Analysis of Zeolitic Materials
H. Shimada, K. Sato, Y. Nishimura, N. Matsubayashi, and M. Imamura・・・・304
Surface Analysis of Cubic SiC Thin Films Prepared by High Vacuum Chemical Vapor Deposition Using 1, 3-Disilabutane
K.-S. Yu, J. W. Lee, M. M. Sung, S.-B. Lee, and Y. Kim・・・・308
Chemical State Analysis of Bi2Sr2CaCu2Oy Single Crystals Heated in Air
Y. Yamauchi, S. Kishida, and H. Tokutaka・・・・312
Core Level Binding Energy Shift of Pd Supported on Al2O3
N. Isomura, K. Dohmae, M. Kimura, Y. Hirose, and M. Yamamoto・・・・315
Substrate Dependence of Secondary Ion Intensities from Langmuir-Blodgett Films Investigated by TOF-SIMS
N. Ogura, Y. Ichinohe, S. Yoshida, T. Watanabe, T. Hoshi, K. Endo, and M. Kudo・・・・318
The Influence of Electron Radiation on ZnS-SiO2 films
A. Kojima, E. Mizoguchi, and M. Takano・・・・322
Ag/TiO2 Composite Ultra-fine Particle Studied with FE-SAM
M. Furuya, M. Soga, Y. Naganuma, and Y. Hirabayashi・・・・326
Application of SIMS to Examination of Coastal Organisms
S. Oishi, T. Samukawa, and A. Shirota・・・・330
Electrode Formation and Surface Analysis of Bi-based Superconducting Ceramics
H. Imao, S. Kishida, and H. Tokutaka・・・・334
Characterization of Nanostructures by Electron Spectroscopies
J. M. Sanz, R. Nunez, G. G. Fuentes, L. Soriano, and C. Morant・・・・338
In-situ Deposition of Metal Nanoparticles on Si (110) Thin Film Surfaces in UHV-FE-TEM
M. Tanaka, M. Takeguchi, and K. Furuya・・・・344
Application of a UHV-MBE-TEM System on the Deposition and HRTEM Study of Indium Nanoparticles
Q. Chen, M. Tanaka, and K. Furuya・・・・348
The Possibility of Chemical State Analysis for Silicide Using XPS
M. Nakamura and Electronic Materials Group of SASJ・・・・352
Compositions of Cross Sections Created with a Gallium Focused Ion Beam
M. Owari, T. Sakamoto, M. Takahashi, Z. Cheng, Y. Kuramoto, and Y. Nihei・・・・356
Composition Change and Surface Morphology Induced by Ion Sputtering for III-V Semiconductors using AES
K. Mogi and M. Suzuki・・・・360