Preface
A way of metrological electro-optical analysis (in Japaneses)K.Goto・・・・382
Lecture: Practical Surface Analysis
Accuracy of Measurements - General Terms of JIS, Uncertainty of Measurement and Inter-laboratory Tests - (in Japaneses)H.Kashimura・・・・383
Papers
Issues in Peak Location by Polynomial Function for XPS (in Japaneses)K.Dohmae・・・・392
On the Charge-up Effect of XPS (in Japanese)
J.Kawai, Y.Mizutani, K.Hayashi, Z.Asaki, and Y.Kitajima・・・・404
Electron Probe Microanalysis of argon in Sputter Deposited Films (in Japaneses)
S.Tanuma・・・・409
High Resolution Auger Depth Profiling of SiO2/Si Multilayer Thin Film
N.Fukumoto, T.Fujimoto, B.Li, I.Kojima, and Η.Takaya・・・・414
Technical Reports
Introduction to Common Data Processing System Version 5 (in Japanese)K.Yoshihara・・・・419
Advanced Peak-Fitting of Μonochromatic XPS Spectra
B.V.Crist・・・・428
Technical Documents
File Structure for Spectral Database (in Japanese)A.Kojima and Database Committee・・・・435
Topical Reports
Discussion on SASJ mailing Group (in Japanese)Editorial Board・・・・442
On the round Robin of Peak Parameter Estimation in XPS Conducted by Powell et al.(in Japanese)
M.Yoshitake・・・・448
Chemical State Analysis in Depth Profiling - Factor Analysis and Least Square Fitting -
I.KoJima・・・・454
Analysis of Auger Depth Profiles with LOGIT (in Japanese)
T.0giwara・・・・458
Making of ”Surface Cleaning Method for InP, InAs, and InSb Wafers” - The inside story - (in Japanese)
H.Nonoue, A.Kojima, M.Nakamura, A.Tanaka, and A.Nisawa・・・・463
Some Unsolved Problems in XPS Qualitative Analysis
Y.Nagatsuka・・・・468
Determination of the Electron Spectrometer Transmission Function by the Bias Method (in Japanese)
F.Sakamoto・・・・469
Application of Self-organizing Maps (SUM) to the Round-Robin CoNi Alloy Spectra Data - By that, is it possible to see the characteristics of the measurement instruments ? -
H.Tokutaka, K.Fujimura, and K.Yoshihara・・・・471
Bulletin Board
Table of Organization and Their Abribiation・・・・・・・・・・・・475
Minutes of Working groups
7th meeting of Database Committee・・・・・・・・・・・・477
11th meeting of Organic Materials Group
・・・・・・・・・・・・478
11th meeting of Inorganic Materials Group
・・・・・・・・・・・・479
11th meeting of Metal Materials Group
・・・・・・・・・・・・480
11th meeting of Electronic Materials Group
・・・・・・・・・・・・481
Regulations of SASJ
・・・・・・・・・・・・483
Regulations of Program Committee, Database Committee, and Editorial Committee
・・・・・・・・・・・・485
Journal of Surface Analysis: Guide for Authors
・・・・・・・・・・・・488