Preface
Proposal for the Direction of Surface Analysis Society of JapanS.Ichimura・・・・533
Lecture:Practical Surface Analysis
Derivation of Energy Loss Function from XPS Background and Related TopicsM.Jo・・・・534
Review
Application of Self-Organizing Maps (SOM) to the data of Chemical Analysis and the Surroundings of SOMH.Tokutaka・・・・545
Papers (Paper from The 3rd Powell Prize Poster Presentation)
Neutralization Method of Diifferential Charging on Non-monochromatized X-ray Photoelectron Spectroscopy AnalysisT.Oyama,S.Nishizawa,and H.Yamamoto・・・・558
Results of Round-Robin Test on Energy Scale Correction for XPS Spectra
K.Dohmae,K.Miura,K.sasakawa, M.Nakamura,T.Maruyama,Y.Shichi, and T.Sekine・・・・565
Results of Round-Robin Test on Intensity Scale Correction for XPS Spectra
M.Nagoshi,Y.Shichi,T.Maruyama, K.Sasakawa,M.Nakamura,K.Dohmae, K.Miura,and A.Tanaka・・・・573
Round-Robin Test on Energy Scale Correction for AES Spectra
M.Suzuki,T.Maruyaama,Y.Ohtsuka, M.Koizumi,M.Nagoshi,amd T.Sekine・・・・589
Some Attempts to Enchance the Accuracy of AES Qualitative Analysis
Y.Nagoshi,K.Yoshida,Y.Nagasawa,and J.Suzumi・・・・602
Time-of-flight Secondary Ion Mass Spectrometry of Oxide Layers Formed on the Surface of Silicon steels
S.Suzuki,M.Totsu,T.Hoshi,H.Iwai,and Y.Waseda・・・・612
Simulation Data of Valence XPS of Polymers by MO Calculations Using the Model Molecules I.Hydrocarbon-Polymers and Polymers containing,O-,CO-,and OCO-Groups
Kazunaka Endo and Delano P.Chong・・・・618
Formation Mechanism of Indium Microcrystals on Ion-Bombarded InP Surfaces
Y.Homma・・・・641
Technical Reports
SEM Observation of the Surface of the InP,InSb,and InAs Wafer after Ion SputteringT.Ogiwara,K.Yoshida,and S.Tanuma・・・・646
Modification of Surface Composition with Ion-Sputtering
A.Kurokawa・・・・653
Sputtering with Reactive lons - Auger depth profiles of GaAS/AIAS Superlattice structure obtained with 02+ ion sputtering -
M.Inoue, H.-I.Lee,and R.Shimizu・・・・659
Sputtering by Focused lon Beam
T.Sekine,K.Sakaguchi,and D.Kanaki・・・・664
Technical Documents
Manual for Describing Items in ISO Format Used in the Network Database (Revised Version)H.Nonoue and Database Committee・・・・670
Glossary
SI UnitsI.Kojima・・・・679
Topical Reports
Effects of Vacuum Conditions on Energy and Intensity Scales of Auger Electron SpectroscopyM.Kato and M.Nagoshi・・・・682
The Determination of Alloy Compositions and the Spectra Identifications by Self- Organizing Maps (SOM)
H.Tokutaka・・・・684
Can hydrogen be observed in an energy analysys?
K.Goto・・・・685
Auger electron spectra of alloys and synthesized:Fe-Ni's
K.Goto・・・・686
Many Electron Effects on Core-Level Electron Spectroscopies
J.Kawai・・・・687
Backgrounds of the Sensitivity Factors of Auger Electron and X-ray Photoelectron Spectroscopies
A.Tanaka and N.Suzuki・・・・699
Salon in SASJ
Discussions on InternetEditorial Committee・・・・704
Bulletin Board
How to use mail group "SASJ"S.Fukushima・・・・713
Conference Report:PSA-97/Powell Prize/Symposium on "Recent Progress of Local and Trace Analysis"
・・・・・・・・・・・・721
Minutes of Working groups
8th and 9th meetings of Organic Materials Group・・・・・・・・・・・・723
8th and 9th meetings of lnorganic Materials Group
・・・・・・・・・・・・725
8th and 9th meetings of Metal Materials Group
・・・・・・・・・・・・726
8th.9th,and ad-hoc meetings of Electronic Materials Group
・・・・・・・・・・・・728
4th and 5th meetings of Database Committee
・・・・・・・・・・・・734
4th and 5th meetings of Database Committee
・・・・・・・・・・・・738
Journal of Suface Analysis: Cumulative Author Index/Contents of Volume 2
・・・・・・・・・・・・745