Lecture
What is "differential filter"Sei FUKUSHIMA・・・・11
Original Paper
Quantitative Analysis Method for X-ray Photoelectron Spectroscopy Including Elastic Scattering Effect.The formalism of quantitative analysis based on the effective inelastic mean free paths.
S. Tanuma・・・・27
Surface Composition of Sputtered InP Surfaces using Auger Electron Spectroscopy
Kadena Mogi, Miyuki Masuda, and Mineharu Suzuki・・・・33
Technical Report
Differentiation in the PHI-ACCESS Software -Numerical Differentiation on Auger Electron Spectroscopy-Akihiro TANAKA・・・・48
Remaining Problems in evaluation of Depth Resolution for Interface Analysis
Toshiya OGIWARA・・・・55
Low Enrgy Sputtering Method and Chemical etching Method of Depth Profile Analysis for Polymer Compound in XPS
Y. Iijima・・・・62
Depth profiling in SIMS
H. Morita, Y.Yoshioka・・・・72
Technical Date
Answer to the Questionnaire of In-depth Analysis using Internet SASJ Mailing GroupMineharu Suzuki and Toshiya Ogiwara・・・・83
Official Data-Input Form for spectral Database(revised edition)
(no English title)
M. Koizumi・・・・88
(no English title)
Hiroshi Nonoue, Atsuko Kojima・・・・102
Surface Chemical Analysis-Information Formats(Comitee Draft Version)
K. Yoshihara・・・・112
NIMC Standard reference Materials Program of Multilayer Thin Ceramics Films
Isao KOJIMA and Haruo TAKAYA・・・・126
Development of Standard Materials for Surface Analysis in KRISS
Hoong-Sun Im,Kyong Joong Kim, Hyun Kyong Kim,and Dae Won Moon・・・・128
Getting Information on Kermit on the Internet
Yoichiro Furukawa・・・・134
Topics
One Invitation LetterKazuhiro Yoshihara・・・・138