Preface
Surface Analysis Society of Japan for Reliability Improvement and StandardizationHisao Makino・・・・1
Review
Surface Analysis of a 28Si-enriched Sphere for a New Kilogram DefinitionLulu Chang・・・・2
Paper
Automatic Threshold Estimation from Photoelectron Yield Spectroscopy (PYS) - Automatic Estimation of Analysis Range by Residual Analysis -Shinjiro Yagyu and Michiko Yoshitake・・・・15
Technical Report
Developing a Materials Curation ® Support SystemMichiko Yoshitake, Fumitaka Sato, and Hiroyuki Kawano・・・・22
The Electronic Band Structure Evaluation of OLED Materials by Combination of LEIPS and UPS
Masahiro Terashima, Takuya Miyayama, Hin Wai Mo, Yasuhiro Hatae, Hiroshi Fujimoto, and Katsumi Watanabe・・・・34
Serial
Vocabulary Used in the Surface Analysis (Preliminary TASSA)SASJ Standardization Committee・・・・45
SASJ Saloon
Instructions to Authors
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JSA Contribution Form
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Copyright Transfer Agreement
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Regular Subscription Order Form
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Back Number Order Form
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Postscript
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