Preface
Cornerstones of Measurement and AnalysisAkira Kurokawa・・・・227
Review
Current Status of BL6N1 of AichiSR: a Tender X-ray Beamline for XAFS and Photoemission SpectroscopyHiroshi Oji, Takaaki Murai, Yoshitaka Shibata, Masao Tabuchi, Yoshio Watanabe, and Yoshikazu Takeda・・・・228
In-situ Observations of Reactions with Environmental Transmission Electron Microscopy
Tadahiro Kawasaki・・・・245
Extended Abstract(Review)
Development of Atmospheric Pressure MeV-SIMS and Solid?Liquid Interface AnalysisToshio Seki・・・・254
Serial
Vocabulary Used in the Surface Analysis (Preliminary TASSA)SASJ Standardization Committee・・・・260
SASJ Saloon
Conference Report on “PSA-19”Takaharu Nagatomi・・・・269
Conference Report on the 22nd Interentaionl Conference on Secondary Ion Mass Spectrometry (SIMS-22)
Akio Takano・・・・282
Conference Report on 84th UK Surface Analysis Forum (UKSAF)
Naoko Sano・・・・286
Reports on the 51st Meeting of the Surface Analysis Society of Japan
・・・・・・・・・・・・289
Reports on the 52nd Meeting of the Surface Analysis Society of Japan
・・・・・・・・・・・・292
Instructions to Authors
・・・・・・・・・・・・297
JSA Contribution Form
・・・・・・・・・・・・301
Copyright Transfer Agreement
・・・・・・・・・・・・302
Regular Subscription Order Form
・・・・・・・・・・・・306
Back Number Order Form
・・・・・・・・・・・・308
Postscript
・・・・・・・・・・・・309