Preface
Expanding New Trends in Surface Analysis to the Younger GenerationKatsuaki Yanagiuchi・・・・91
Extended Abstract of PSA-19
Toward Construction of Measurement/Characterization Platform for Open InnovationShingo Ichimura・・・・92
Positive and Negative Contributions of XPS to Reproducibility Issues
Donald R. Baer and M. H. Engelhard・・・・94
Round-Robin Test of the MEIS for Quantitative Depth profiling of Ultrathin HfO2/SiO2/Si Films
Won Ja Min, Gabriel M. Marmitt, RRT Participants, Pedro L. Grande, and DaeWon Moon・・・・96
Issues on thickness measurements of nm HfO2 film by X-ray photoelectron spectroscopy
Ansoon Kim, Yoon Sang Lee, and Kyung Joong Kim・・・・98
Standardization of Spatial Resolution of Analytical Optical Spectroscopy
Jeongyong Kim・・・・100
Characterisation on nanomaterials: XPS analysis of Core-Shell Nanoparticles
Wolfgang S.M. Werner, Martin Hronek, Michael Stoger Pollach, and Henryk Kalbe・・・・102
Elastic scattering effects in quantitative AES and XPS: Case studies
A. Jablonski・・・・104
Electron inelastic mean free paths in compounds
Shigeo Tanuma, Hiroshi Shinotsuka, Cedric J. Powell, and David R. Penn・・・・106
Low-Energy Electron Inelastic Mean Free Path
Hieu T. Nguyen-Truong・・・・108
White-beam electron technique for nanomaterial characterization
Bo Da, Jiangwei Liu, Hideki Yoshikawa, and Shigeo Tanuma・・・・110
Development of High Performance Printed Organic Transistors by Controlling Charge Carrier Density
Yong-Young Noh・・・・112
Electronic Structures of Two-Dimensional Materials
Daesung Jung, Dongseok Oh, and Chan-Cuk Hwang・・・・114
Scanning and Full Field X-ray Fluorescene Imaging with Laboratory X-ray Source
Kouichi Tsuji, Momotaro Nakanishi, Ryouta Ozeki, and Tsugufumi Matsuyama・・・・116
Quantitative Analysis on Diffused Trace Elements by Atom Probe Tomography
Bong Ho Lee, Taehoon Cheon, Youngmoo Eun, Ki Hee Kim, Jin Bae Bang, Byung Mok Sung, and Sang-il Kim・・・・118
Single Layer Graphene Assisted Transmission Mode Continuous Wave Laser Desorption for Micrometer Spatial Resolution Atmospheric Pressure Mass Spectrometry Imaging
Jae Young Kim and Dae Won Moon・・・・120
Cluster-induced desorption/ionization mass spectrometry as a versatile tool for the analysis of complex molecules and their reactions on surfaces
Karolin Bomhardt, Pascal Schneider, and Michael Dürr・・・・122
Developments in Practical Applications of Inelastic Background Analysis to Characterize nano-structures
Sven Tougaard・・・・124
Automated peak fitting of XPS spectrum using information criteria
Hiroshi Shinotsuka, Hideki Yoshikawa, Ryo Murakami, Kazuki Nakamura, Hiromi Tanaka, and Kazuhiro Yoshikawa・・・・126
Revision of optical properties of solids based on the reverse Monte Carlo analysis of reflection electron energy loss spectroscopy spectra
K. T?kesi, L.H. Yang, B. Da, and Z.J. Ding・・・・128
Bayesian Estimation for Spectral Deconvolutiong
Kenji Nagata・・・・130
Analysis of TOF-SIMS and microscope fused image data using sparse modeling and deep learning
Satoka Aoyagi, Tomomi Akiyama, and Takayuki Yamagishi・・・・132
Utilizing Knowledge on Scientific Principles on Material Properties for Materials R&D
Michiko Yoshitake・・・・134
Studies of III-V Semiconductor Materials and Devices Using Different Analytical Technologies
Lixia Zhao・・・・136
Chemical-state-discriminated hard X-ray photoelectron diffraction study for polar InN
Yoshiyuki Yamashita, Anli Yang, and Keisuke Kobayashi・・・・138
Novel approaches for analyzing nanoparticles using Atom Probe Tomography
Pyuck-Pa Choi, Se Ho Kim, and Kyuseon Jang・・・・140
SIMS investigation of internal hydrogen behavior of TWIP steel
Jae Nam Kim and Chong Soo Lee・・・・142
In-situ observation of the interaction silicon and hematite
Nobuhiro Ishikawa, Tadashi Mitsui, Masaki Takeguchi, and Kazutaka Mitsuishi・・・・144
Applications of surface analysis to Oxide Thin Film Devices
Hee Jae Kang・・・・146
Energy and Direction Resolved Secondary Electron Imaging using Fountain Detector
Takashi Sekiguchi, Toshihide Agemura, and Hideo Iwai・・・・148
Micro-Spectroscopy in the Low-Energy Regime: Secondary Electron Detection and Energy Analysis in the Scanning Field-Emission Microscope
Alessandra Bellissimo, Danilo Pescia, Christopher Walker, Gabriele Bertolini, Ashish Suri, and Oguzhan Gürlü・・・・150
Traceable Thickness Measurement of nm Oxide Films by Mutual Calibration
Kyung Joong Kim, Ansoon Kim, Jihwan Kwon, Chang Soo Kim, and Won Ja Min・・・・152
Standardized Estimation of Spatial Resolution of Confocal Raman Imaging
Eunji Lee, Youngbum Kim and Jeongyong Kim・・・・154
Quantitative HAXPES
Alexander G. Shard・・・・156
Development of Ambient Pressure Hard X-ray Photoelectron Spectroscopy at SPring-8
Yasumasa Takagi・・・・158
Observation of Pt-NiO1-x nanostructure formation on Pt3Ni(111) surface with ambient pressure XPS and STM
Bongjin Simon Mun・・・・160
Near Ambient Pressure X-ray Photoelectron Spectroscopy(NAP-XPS). Characterization of Non-Traditional Materials with the SPECS EnviroESCA Instrument
Dhananjay I. Patel, Paul Dietrich, Andreas Thißen, and Matthew R. Linford・・・・162
Towards standardising electron spectroscopy measurement of nanoparticle coatings
David Cant, Charles Clifford, Alex Shard, Anja Muller, and Wolfgang Unger・・・・164
Hard X-ray photoelectron spectroscopy of transparent conductive heavily doped ZnO thin films
Hisao Makino・・・・166
From the development of methods for fitting photoemission spectra to their practical applications: bridging the gap
M. Bravo-Sanchez, A. Herrera-Gomez, A. Romero-Galarza, and Nima Golsharifi・・・・168
Chemical State Quantification of X-ray Auger Electron Spectrum with Top-Hat Filtering
Yasuko Kajiwara, Mayu Kinoshita, and Takashi Oyama・・・・170
Surface Etching and Passivation of Black Phosphorus by Thermal Annealing
Sena Yang and Jeong Won Kim・・・・172
Metabolic imaging at the single-cell scale — recent advances and future challenges in mass spectrometry imaging by Thermal Annealing
I S Gilmore・・・・174
Practical applications of SIMS in material and biological research
Masayuki Okamoto・・・・176
TOF-SIMS MS/MS Depth Profiling of OLED Devices -Toward the Elucidation of Degradation Process-
Shin-ichi IIDA・・・・178
Dissecting the metallic Fe 2p photoemission spectrum
A. Herrera-Gomez, J.F. Fabian-Jocobi, O. Cortazar-Martinez, Abraham Cardona-Cardona, and Joaquin-Gerardo Rabono-Borbolla・・・・180
Enhancing Surface and Thin Film Analysis Through In-Situ Complementary Raman Spectroscopy
Adam Bushell, Paul Mack, and Tim Nunney・・・・182
A Multi-Technique Approach for a Complete Thin Film Characterisation
N. Gerrard, J. Counsell, A. Roberts, C. Blomfield, C. Moffitt, and T. Conard・・・・184
Fine structure of spectrum of secondary electron, 5: metals and their compounds
Satoshi Hashimoto, Tsuguo Sakurada, Keisuke Goto, Shigeo Tanuma, and Takaharu Nagatomi・・・・186
Application of Electronic Laboratory Notebook for Analysis Records in Materials Research
Mineharu Suzuki, Yoshitomo Harada, Yutaka Ueshima, Shigeyuki Matsunami, Keisuke Goto, and Hideki Yoshikawa・・・・188
Novel electron microscopy method for accurate measurements of the lattice constant changes in layered structures
Raman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Fumihiko Uesugi, and Masaki Takeguchi・・・・190
Development and Application of “Soft” Probe for Various Types of Electric Measurements
Michiko Yoshitake, Yusuke Nakaune, and Kentaro Kinoshita・・・・192
DFocused Ion Beam-Atomic Force Microscopy Technique for Sidewall Roughness Measurement of Free-Standing Objects with Sub-mm Size
T. Nakao, Y. Fujimoto, and T. Nagatomi・・・・194
Analysis of dissolved components from diesel soot particles
Toru Murata, Kodai Takano, Masato Morita, and Tetsuo Sakamoto ・・・・196
Imaging of cisplatin in single cancer cell and visualizing its mechanism of action by FIB-TOF-SIMS
Kazuya Tamura, Takurou Hasegawa, Masato Morita, Kumiko Nagase, Masatoshi Kakihana, Naohiro Kajiwara, Tatsuo Ohira, Norihiko Ikeda, and Tetsuo Sakamoto・・・・198
Complementary analysis for dislocations of GaN compound semiconductors using STEM and APT
Norihito Mayama, Kei Watanabe, Kazuya Toda, Jun Koyama, Satoshi Ishimura, Mina Suganuma, and Masakazu Sugiyama,・・・・200
Charge Compensation in Hard X-ray Photoelectron Spectroscopy by Electron Beam of Several Kilo-electron-volts
Satoshi Yasuno・・・・202
Improvement of mapping quality by reflection of a laser beam in Resonance-SNMS
Yuzuka Ohmori, Yuta Miyashita, Yue Zhao, Masato Morita, Tetsuo Sakamoto, Kotaro Kato, Volker Sonnenschein, Hideki Tomita, Toshihide Kawai, Takeo Okumura,Yukihiko Satou, Masabumi Miyabe, and Ikuo Wakaida・・・・204
IULV-SEM-EDX analysis of fine precipitates in Cr-Mo steel using windowless silicon-drift detector
Takaya Nakamura, Kaoru Sato, and Masayasu Nagoshi・・・・206
Shape identification and classification of aerosol particles using SEM image
Ryota Koiwai, Kodai Takano, Masato Morita, and Tetsuo Sakamoto・・・・208
Detection method for ring-shape agglomerations formed by drying nanoparticle-dispersed droplet
Akira Kurokawa, Kazuhiro Kumagai, Satoru Akai, Nobuo Handa, Yoshikazu Sasaki, Naoki Kikuchi, Shin-ichi Kitamura, and Hironobu Manabe・・・・210
Scattering-angle Selective STEM Images for a Co-Cr-Mo Alloy Fabricated by Selective Laser Melting
Masayasu Nagoshi, Susumu Tsukimoto, Kenji Ogata, Takaya Nakamura, and Yoshimitsu Okazaki・・・・212
Characterization of Al-doped ZnO thin films by laboratorybased hard X-ray photoelectron spectroscopy system
Itsuki Takeda, and Hisao Makino・・・・214
Chemical state analysis for buried Al2O3 layer of Y2O3/Al2O3 multi-layer film using laboratory HAXPES
Shinsuke Nishida, Shinya Yasunaga, Shinya Otomo, and Hirokazu Sasaki・・・・216
Matrix assisted laser desorption/ionization mass spectrometry imaging method for visualizing spatial distribution of synthetic polymers combining with Kendrick mass defect analysis
Takaya Satoh and Yoshihisa Ueda,・・・・218
Changes of Calcium Distribution in Glue Ball of Spider's Orb-web under Low-temperature Stress
Yue Zhao, Masato Morita, and Tetsuo Sakamoto・・・・220
Interface charge transfer between metal phthalocyanine and fluorinated hexaazatrinaphthylene molecules
Hui Ung Hwang, Sena Yang, and Jeong Won Kim・・・・222
SASJ Saloon
Author Index・・・・・・・・・・・・224
Postscript
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