Preface
Presents from SASJMasahiko Inoue・・・・164
Paper
Angular Distribution of Sputtered Particles in Shave-off Section Processing with SDTrimSPSo-Hee Kang, Kohei Matsumura, Takeki Azuma,
Bunbunoshin Tomiyasu, and Masanori Owari・・・・165
Development of Secondary Ion Optical System to Achieve Three-Dimensional Shave-off SIMS
Kohei Matsumura, So-Hee Kang, Bunbunoshin Tomiyasu, and Masanori Owari・・・・172
Technical Report
Development of the Curved Surface Sample Holder for TOF-SIMS ImagingShin-ichi Iida, Takuya Miyayama, and Ibuki Tanaka・・・・181
Serial Lecture ( Extended Abstract ): Practical Surface Analysis - Knowledge of Surface Analysis for Beginners
Introduction to Surface AnalysisKatsuaki Yanagiuchi・・・・192
Sample Handling and Sample Pretreatment
Sawa Araki・・・・202
Translated Article
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion BeamT. Ogiwara, T. Nagata, and H. Yoshikawa ・・・・209
SASJ Saloon
Conference report on The 13th Korean Symposium on Surface Analysis (KoSSA-13)Hisao Makino and Sumihiro Matsumura・・・・221
Instructions to Authors
・・・・・・・・・・・・230
JSA Contribution Form
・・・・・・・・・・・・234
Copyright Transfer Agreement
・・・・・・・・・・・・235
Regular Subscription Order Form
・・・・・・・・・・・・239
Back Number Order Form
・・・・・・・・・・・・241
Postscript
・・・・・・・・・・・・242