Preface
Each Practical Surface Has Its Own ThicknessNoboru Suzuki・・・・1
Review
Utilization of Information on Materials in Multi-DimensionalMichiko Yoshitake・・・・2
Investigation of Sample Deformation in Laser-Assisted Atom Probe Tomography
Yun Kim and Masanori Owari・・・・9
Paper
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incident Ion BeamT. Ogiwara, K. Yanagiuchi, and H. Yoshikawa・・・・14
Extended Abstract
Study on Electronic States of Indium Zinc Oxide Films by Electron SpectroscopiesAsami Yasui and Shingo Ogawa・・・・21
New Development of Depth Profiling in XPS
Hitoshi Tomizuka, Masatake Machida, and Retsu Oiwa・・・・25
Application of Scanning Transmission X-ray Microscope on Polymer Materials
Jun Kikuma, Misato Kazama, Hiroki Umemoto, and Yasuo Takeichi・・・・34
Ability in Surface Analysis of Soft X-ray XAFS taken with the Fluorescence Yield Mode
-- Probing Depth and Self-Absorption Correction Method
Noriaki Usuki, Akiko Ito, Takeharu Adachi, Hiroko Hayamizu, and Keisuke Yamanaka・・・・37
Application and Task for Secondary Battery during Operation using Soft X-ray XAFS
Koji Nakanishi ・・・・39
SASJ Saloon
Conference report on 21st International Conference on Secondary Ion Mass Spectrometry (SIMS XXI)Yuji Hori・・・・43
Activity Reports of 5th Meeting of Young SASJ Members
Young SASJ Members Mainly in Their 20's and 30's・・・・48
Instructions to Authors
・・・・・・・・・・・・67
JSA Contribution Form
・・・・・・・・・・・・70
Copyright Transfer Agreement
・・・・・・・・・・・・71
Regular Subscription Order Form
・・・・・・・・・・・・75
Back Number Order Form
・・・・・・・・・・・・77
Postscript
・・・・・・・・・・・・78