Preface
China's Surface Science and Surface Analysis Technology of the Third Development OpportunitiesZhanping Li・・・・174
Review
The Usage of COMPRO12 (part 2)K. Yoshihara・・・・175
Paper
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion BeamT. Ogiwara, T. Nagata, and H. Yoshikawa・・・・192
Technical Report
Analysis of the Carbon Film on the Ibushi-Kawara in Sanshu used by X-ray Photoelectron Spectroscopy, Raman Spectroscopy and X-ray Absorption Spectroscopy.Osamu Fukuoka, Takanori Sugimoto, Toshiaki Nakao, Kouji Hoshi, Nobuyuki Sugiyama, Takaaki Murai, and Haruki Murase
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Extended Abstract
Guide of SESSA for Electron SpectroscopyKaoru Miura and Hideki Yoshikawa・・・・212
SASJ Saloon
Report on Question and Answer at ISO Seminar '17Takaharu Nagatomi・・・・227
Conference report on The 12th Korean Symposium on Surface Analysis (KoSSA-12)
Daisuke Kobayashi・・・・232
Participating Report on 17th European Conference on Applications of Surface and Interface analysis (ECASIA '17)
Satoshi Yasuno・・・・234
Reports on the Symposium on Practical Surface Analysis 2017
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Instructions to Authors
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JSA Contribution Form
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Copyright Transfer Agreement
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Regular Subscription Order Form
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Back Number Order Form
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Postscript
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