Preface
Towards practical use of ISOIsao Kojima・・・・1
Review
The Usage of COMPRO12 (part 1)K. Yoshihara・・・・2
Progress of MassBank towards the Global Standard of Mass Spectral Database
Takaaki Nishioka・・・・25
Technical Report
Automatic Estimation of XPS spectrum Background Using an Active Shirley Method Improved by Auto-Tuning Function of Initial End PointsYugo Nishizawa, Ryo Matsumoto, Noriyuki Kataoka, Hiromi Tanaka,Hideki Yoshikawa, Shigeo Tanuma, and Kazuhiro Yoshihara・・・・36
Study of Surface Cleaning Conditions by the Ar-GCIB for XPS Analysis
Ako Miisho, and Masayuki Inaba・・・・47
Extended Abstract
Structural Analysis in the Surface of Nitride Semiconductor by Grazing Incidence X-ray DiffractionTsukasa Motoya, Kenichiro Kurahashi, and Yasushi Uehara・・・・56
Q&A
Questions on "J. Surf. Anal. 21, 2 (2014)"Mineharu Suzuki・・・・61
Answers to the "Questions on J. Surf. Anal. 21, 2 (2014)"
Hiroshi Okumura, and Kazuhisa Mine・・・・62
SASJ Saloon
Report on Question and Answer at JASIS Conference 2017 "Practical surface analysis - knowledge of surface analysis for beginners"Takaharu Nagatomi・・・・64
Reports on the 49 th Meeting of Surface Analysis Society of Japans
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Activity Reports of 4th Meeting of Young SASJ Members
Young SASJ Members Mainly in Their 20's and 30's・・・・72
Instructions to Authors
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JSA Contribution Form
・・・・・・・・・・・・95
Copyright Transfer Agreement
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Regular Subscription Order Form
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Back Number Order Form
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Postscript
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