Preface
More better than the past of myself!!Makoto Nakamura・・・・1
Review
Laser Desorption Ionization Imaging Mass Spectrometry for Surface AnalysisTakaya Satoh, Makiko Fujii, and Jiro Matsuo・・・・2
Letter
Cross-section Observation of Inorganic/Organic Materials by Using FIB-TOF-SIMSShin-ichi Iida・・・・11
Technical Report
Characterization of the Corrosion Product of Plating by XAFSNobuyuki Sugiyama, Yoko Yoshida, Takanori Sugimoto, Toshiaki Nakao, and Hiroaki Kobayashi・・・・19
SASJ Saloon
Pertipating Report on 16th European Conference on Applications of Surface and Interface analysis (ECASIA '15)Masahide Shima・・・・30
Guideline for Authors of Journal of Surface Analysis
Noriaki Sanada・・・・34
Activity Reports of Depth Profiling Working Group at the 46th Meeting of SASJ
Depth Profiling WG・・・・36
Activity Reports of XPS Working Groups at the 46th Meeting of SASJ: Spectral Database Group
XPS WG・・・・38
Activity Reports of XPS Working Groups at the 46th Meeting of SASJ: XPS Quantification Group
XPS WG・・・・40
Activity Reports of ToF-SIMS Working Groups at the 46th Meeting of SASJ
ToF-SIMS WG・・・・41
Instructions to Authors
・・・・・・・・・・・・58
JSA Contribution Form
・・・・・・・・・・・・61
Copyright Transfer Agreement
・・・・・・・・・・・・62
Regular Subscription Order Form
・・・・・・・・・・・・66
Back Number Order Form
・・・・・・・・・・・・68
Postscript
・・・・・・・・・・・・71