Preface
I Believe that Standardization of Surface Analysis Helps Our Life Become ConvenientAkio Takano・・・・81
Review
Applications of Ar Gas Cluster Ion Beam to Oxide Thin FilmsKyung Joong Kim・・・・82
Tutorial: Current Status of Standardization for Practical Surface Analysis Methods and Activities of KRISS
Chanae Park, Hongchol Chae, Nam Seok Park and Hee Jae Kang・・・・96
Rapid Communication
XPS Analysis of BaTiO3 Single Crystal Cleaned by Ar Gas Cluster Ion BeamMasaaki Sekim Hiromi Tanaka, Noriyuki Kataoka, and Satoru Kishida・・・・103
Technical Report
Effect of Incidence Angle of Ions Caused by Inaccuracy of Stage Tilt Angle and Stage Rotation Angle on Sputter Depth Profiling AnalysisSumihiro Matsumura・・・・110
SASJ Saloon
Conference report on The 10th Korean Symposium on Surface Analysis (KoSSA-10)Shinya Ootomo・・・・118
Conference report on The 11th Korean Symposium on Surface Analysis (KoSSA-11)
Hiroto Ito・・・・120
XPS WG・・・・122
Activity Reports of Depth Profiling Working Groups at the 45th Meeting of SASJ
Depth Profiling WG・・・・128
Activity Reports of ToF-SIMS Working Groups at the 45th Meeting of SASJ
D. Kobayashi, S. Iida and ToF-SIMS WG・・・・130
Instructions to Authors
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JSA Contribution Form
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Copyright Transfer Agreement
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Regular Subscription Order Form
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Back Number Order Form
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Postscript
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