Preface
Where and what would you like to take ?M. Suzuki・・・・1
Paper
Round Robin Test for the Quantification and Standardization of Sample Damage during XPS MeasurementsF. Kurayama, N. Suzuki, M. Sato, T. Furusawa, H. Isahara, Y. Kikuchi, S. Fukushima, M. Takano, E. Iwase, R. Inoue, M. Sato, and T. Itoh・・・・2
Review
XPS Measurement of Organic Thin Film on Solid Surface and its ApplicationN. Suzuki・・・・12
Serial Lecture
Introduction to Electron Optics for the Study of Energy Analyzing System (13)M. Kato・・・・20
Photoemission Electron Spectroscopy I: History and Overview
J. D. Lee, T. Nagatomi, G. Mizutani, and K. Endo・・・・42
SASJ Saloon
Conference Report on “SAS-09”H. Yoshikawa, T. Nagatomi, and K. Takahashi・・・・64
Bulletin Board
Quantification of the Behavior of Noise (Preliminary Discussion for SASJ Project)S. Fukushima・・・・70
Erratum
Erratum: “Oxygen Enhanced Surface Roughening of Si(111) Induced by Low-Energy Xe+ Ion Sputtering” [J. Surf. Anal. 15 , 325 (2009)]T. Miyagawa, K. Inoue, and M. Inoue・・・・73
Annual Report of SASJ (2008)
K. Yanagiuchi・・・・74
Instructions to Authors
・・・・・・・・・・・・82
JSA Contribution Form
・・・・・・・・・・・・87
Copyright Transfer Agreement
・・・・・・・・・・・・89
Regular Subscription Order Form
・・・・・・・・・・・・92
Back Number Order Form
・・・・・・・・・・・・94
Postscript
・・・・・・・・・・・・96
Abstracts of Practical Surface Analysis 2008 (PSA-08)
P-1 ~ P-32・・・・A-1 ~ A-32
O-1 ~ O-6
・・・・A-33 ~ A-50