Preface
History Repeats ItselfM. Arai・・・・1
Review (in Japanese)
Solid State Surfaces and Plants Observed by Second-Order Nonlinear Optical MicroscopiesY. Miyauchi, H. Sano, and G. Mizutani・・・・2
Technical Report (in Japanese)
Energy Shifts of the C 1s Lines from Adventitious Hydrocarbons on Gold SurfacesA. Koizumi, K. Yamauchi, M. Sato, M. Takano, and Adventitious Hydrocarbon Project of SASJ・・・・16
Questionnaires Survey for Depth Profiling
T. Nagatomi, K. Takahasi, and H. Yoshikawa・・・・27
Application of Focused Ion Beam Technique to Thin-Film Sample Preparation
for Auger Electron Spectroscopy-Sputter Depth Profiling of Deep Interfaces
M. Satoh, Y. Seyama, and T. Itakurao・・・・40
Application of Cross Section Polisher to Sample Preparation for Surface Analysis
K. Nakamura, H. Amita, S. Takahashi, and S. Matsumoto・・・・50
Serial Lecture (in Japanese)
Introduction to Electron Optics for the Study of Energy Analyzing System (12)M. Kato・・・・59
Extended Abstract (in Japanese)
Applications of Surface Analysis with Fourier Transform Infrared SpectrometerT. Tsuchibuchi・・・・85
SASJ Saloon (in Japanese)
Proposal for International SASJ Mini WorkshopH. Yoshikawa, T. Nagatomi, and K. Takahasi・・・・89
Bulletin Board（in Japanese）
2007 Annual Report of ToF-SIMS Working GroupY. Abe and ToF-SIMS Working Grope・・・・91
Activity Report of XPS Working Grope (2007) ?Preliminary Results of Mini Round Robin Test-
H. Tohma・・・・96
Annual Report of SASJ (2007)
S. Tanuma・・・・100
Instructions to Authors
・・・・・・・・・・・・107
JSA Contribution Form
・・・・・・・・・・・・112
Copyright Transfer Agreement
・・・・・・・・・・・・114
Regular Subscription Order Form
・・・・・・・・・・・・117
Back Number Order Form
・・・・・・・・・・・・119
Postscript
・・・・・・・・・・・・121