Proceedings of PSA-07 (International Symposium on Practical Surface Analysis)
November 25-28, 2007, Kanazawa, Japan
Preface
S. Tanuma・・・・292
Plenary
Surface Characterization in Biomaterials Applications (Invited)H. J. Mathieu・・・・293
10th Anniversary of Powell Prize
Growth and Trends in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy (Review, Invited)C. J. Powell・・・・299
Sputtering, Cluster Primary Ions and Static SIMS (Invited)
M. P. Seah・・・・305
Theory/Simulation
Database construction of Secondary electron emission - Monte Carlo approach combined with supplementary experiment -(Special lecture, Korea-Japan Symposium)
*T. Iyasu and R. Shimizui・・・・312
Theory of High-energy Phtotemission (Invited)
T. Fujikawa・・・・316
Dynamic Monte Carlo Simulation for High Resolution Depth Profiling of Si/Ge Multilayer Film (Invited)
*H. J. Kang, J. S. Jang, N. S. Park, K. J. Kim and H. I. Lee・・・・322
Relativistic Spin-Polarized X-ray Photoelectron Diffraction Theory from Heavy Elements
*K. Ito, T. Konishi and T. Fujikawa・・・・328
Theoretical Study of Plasmon Loss Peaks in Core-level Photoemission Spectra: Energy and Angular Dependence
*H. Shinotsuka, T. Uwatoko, T. Konishi and T. Fujikawa・・・・332
Depth Distribution of Photoelectron Yield Calculated by Multiple Scattering Theory
*H. Shinotsuka, H. Arai and T. Fujikawa・・・・336
Theoretical analysis of AES of 2nd periodic element containing substances
*Y. Takagi, K, Takaoka, S. Shimada, K. Endo, K. Kato, T. Ida and M. Mizuno・・・・340
XPS Spectral Simulation of Chitosan in Thermal Decomposition Process
*K. Tamura, K. Endo, Y. Takagi, K. Kato, D. Matsumoto, T. Ida, M. Mizuno, Y. Suzuki, K. Takahashi, K. Uchida and H. Yajima・・・・344
X-Ray Photoelectron Spectral Analysis for Carbon Allotropes
*K. Endo, D. Matsumoto, Y. Takagi, S. Shimada, T. Ida, M. Mizuno, K. Goto, H. Okamura, N. Kato and K. Sasakawa ・・・・348
Theoretical Study of Multi-atom Resonant Photoemission
*H. Arai and T. Fujikawa・・・・352
Data analysis/Treatment
Common Data Processing System for ISO Standards (Invited)K. Yoshihara・・・・356
A background subtraction program for photo- and Auger electron spectra
M. Jo・・・・360
Performance analysis of algorithms to detect peaks in XPS spectra
*Y. Furukawa, N. Ikeo , Y. Nagatsuka, M. Yoshitake and A. Tanaka・・・・365
Application/bio-material, organic material
Surface Analysis of Biomolecules: Unravelling biointerfacial interactions (Invited)*S. L. McArthur, G. J. S. Fowler and G. Mishra・・・・370
TOF SIMS
Development of a Standards Base for Static SIMS (Invited)I. S. Gilmore・・・・376
Oxidation Process of Phosphite Antioxidants Monitored by ToF-SIMS
*Y. Abe and H. Yamauchi・・・・383
Secondary ion mass spectrometry using size-selected gas cluster ion beam
* M. Hashinokuchi, K. Moritani, J. Nakagawa, T. Kashiwagi, N. Toyoda and K. Mochiji・・・・387
Application
Surface and Interface Analysis using High Energy Electron Spectroscopy (Invited)L. Kövér・・・・391
XPS: Issues with Data Acquisition and Data Processing (Invited)
J. T. Grant・・・・398
Applying Surface Analysis in Electronics Materials Processing (Review, Invited)
W. F. Stickle・・・・406
In-situ Characterization of MgO Surface with Discharge Aging at Elevated Temperatures of AC-Plasma Display Panels
(Invited, Korea-Japan Symposium)
M. H. Joo, K. H. Park and *J. W. Lee・・・・412
Analysis of SiO2 Films on Si Substrate by GD-OES Depth Profiling and GIXR Measurements
*S. Suzuki, S. Sato and K. Kakita・・・・416
Study of Implanted B+ and P+ Ions into Si(100) for Ultra Shallow Junction by SIMS
*Y. S. Lee, W. J. Lee, M. H. Lee and S. K. Rha・・・・420
Electronic Structure of the Bulk of Titanium Hydrides Fractured in Ultrahigh Vacuum by XPS Surface Analysis
*B. Tsuchiya, M. Oku, R. Sahara, S. Nagata, T. Shikama and Y. Kawazoe・・・・424
Lateral Resolution of EDX Analysis with Low Acceleration Voltage SEM
*S. Hashimoto, T. Sakurada and M. Suzuki・・・・428
Photoelectron spectrometer equipped with open counter for electronic structures of organic materials
*D. Yamashita, Y. Nakajima, A. Ishizaki and M. Uda・・・・433
Si Wafer Surface Etched by Water Droplet Cluster Ion Analyzed with SEM, SPM and XPS
*Y. Iijima, M. Kudo, Y. Sakai and K. Hiraoka・・・・437
Dopant Profiling on 4H Silicon Carbide P+N Junction by Scanning Probe and Secondary Electron Microscopy
*O. Ishiyama and S. Inazato・・・・441
Characterization of Pd(PVP) nanoparticles studied by AFM, Pd L3-edge and Cl K-edge NEXAFS
*S. Yagi, T. Ashida, T. Nomoto, H. Namatame and M. Taniguchi・・・・444
Temperature dependence of Er nano structure on InP(001)
T. Mochizuki, *S.Yagi, M. Kato, K. Soda, H. Namatame and M. Taniguchi・・・・449
Coadsorption behavior of (CH3)2S with H2O or D2O on Rh(100) studied by XPS and NEXAFS
*T. Nomoto, S. Yagi, K. Soda, H. Namatame and M. Taniguchi・・・・453
Reaction of L-cysteine on Rh(PVP) nanoparticle surface by NEXAFS
*S. Gohda, T. Ashida, S. Yagi, H. Namatame and M. Taniguchi・・・・458
Dissociation reaction of (CH3)2S adsorbed on Pd nanoparticles fabricated by gas evaporation method
*M. Morihara, K. Miura, T. Nomoto and S. Yagi・・・・462
Extremely Smooth Surface Etching by Giant Cluster Ion Impact
*Y. Sakai, Y. Iijima, K. Mori and K. Hiraoka・・・・466
Implant dose measurement and depth profiling of 10-keV implanted As by high-resolution RBS
*C. Ichihara, A. Kobayashi and K. Kimura・・・・469
Member of the Committee of PSA-07
・・・・・・・・・・・・473