Preface
A Merit of JSA we should growM. lnoue・・・・283
Paper
Change of Energy Distribution of He+ Induced Electrons from MgO Thin Film with Ion IrradiationT. Tsujita, K. Nakayama, T. Nagatomi, Y. Takai, Y. Morita, M. Nishitani, M. Kitagawa and T. Uenoyama・・・・284
Determination of Escherichia coli Negative Charge Concentration From XPS Data and Its Variation with pH
F. Hamadi, H. Latrache, A. Elghmari, H. Zahir, M. Mabrrouki and A. E. Elbouadili・・・・293
Sample preparation for TXRF measurement by glow discharge sputtering
M. Nakata and K. Tsuji・・・・303
Lecture (in Japanese)
A Cluster Classificahon of XPS, AES Spectra by Spherical Self-Organizing Maps (SSOM)- An Empirical Use of Software "blossom" -
H. Tokutaka and D. Nakatsuka・・・・308
Software and Standardization in Surface Chemical Analysis
T. Nagatomi・・・・316
Serial Lecture(in Japanese)
Introduction to Electron Optics for the Study of Energy Analyzing System (5)M. Kato・・・・327
A way to get true electron energy spectra of SI compatible by experiments (Ⅳ)
K. Goto・・・・350
How to express the attenuation of signal electrons in surface electron spectroscopy
Ⅲ. Quantitative Surface analysis by XPS and AES
S. Tanurea・・・・357
Salon in SASJ (in Japanese) "Standardization of Nanotechnologies"
D. Fujita・・・・363
Postscript
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