Preface
JSA in the next decadeM. Jo・・・・164
Paper
Site-specific x-ray photoemission spectroscopy of SrTiO3 crystals by x-ray standing wave techniqueT. Fujii, M. Kimura, H. Yoshikawa and S. Fukushima・・・・165
Coating Materials for an Absolute Electron Energy Analyzer(CMA)
W. Y. Li, K. Goto, J. Takioto, S. Tanaka, H. Morikawa and R. Shimizu・・・・170
Lecture(in Japanese)
Recent Trend of Standardization of Scanning Proce Microscope and Standards for CalibrationT. Kurokawa・・・・178
Fusion of Nanofabrication and Nanocharacterization Using Scanning Tunneling Microscopy : Active Nano - Characterization
D. Fujita, K. Onishi, K. Sagisaka and T. Ohgi・・・・188
Introduction to Electron Optics for the Study of Energy Analyzing Systems(3)
M. Kato・・・・196
A way to get "true" electron energy spectra of SI compatible by experiments（Ⅲ）
K. Goto・・・・222
Vocabulary Used in the Surface Analysis (Preliminary TASSA)
SASJ Standardization Committee・・・・230
Postscript
・・・・・・・・・・・・232