Special Issue for Memory of Dr. Tetsu Sekine
Preface
Are you watching a butterfly ?K. Yoshihara・・・・120
Papers & Reviews
New Development in Depth Profiling Using AESS. Hofrnann・・・・121
Peak Intensity Measurement in the Early Days of AES
J. T. Grant・・・・125
Standardization of SIMS Sharrow Junctiopn Profiling with Multiple Delta-Layer Thin Films
D. W. Moon, H. I. Lee, H. K. Kim, H. J. Kang, J. C. Lee, H. K. Shon, J. Y. Won, and F. Toujou・・・・132
Changes of XPS Spectra from Oxides by Ion Bombardment
S. Hashimoto・・・・136
Investigation of Mesh Opening Size in Mesh-Replica Method Toward Standardization of Depth Prof'lling Technique
M. Suzuki, K. Mogi, and T. Ogiwara・・・・144
The Development of the Common Data Processing System
K. Yoshihara・・・・148
Application of a Low Energy Ion Gun for High Resolution Depth Profiling
R. Shimizu and M. Inoue・・・・154
NIST Databases for Surface Analysis by Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
C. J. Powell and A. Jablonski・・・・158
Quantitative Auger and X-Ray Photoelectron Analysis of Au-Cu Alloys with Three Kinds of Relative Sensitivity Factors
S. Tanuma and T. Kimura・・・・163
Accuracy of Carbide Analysis Using Auger Electron Spectroscopy
J. D. Geller・・・・169
Current State of Scanning Auger Microscopy Using FIB Sample Preparation
Y. Sakai・・・・174
Direct Measurement of Nonresonant Multiphoton Ionization Profile for Xe Atoms - dependence on incident laser wavelength and ionized charge state -
S. Ichimura・・・・181
Essay
Legacy of Tetsu Sekine in AESA. Mogami・・・・185
Dr. Tetsu Sekine from My Negative Files
K. Goto・・・・188
Memory of Dr. Tetsu Sekine
Y. Arai・・・・193